下载中心
-
2018-03-26 Thickness-measurement-of-SiO2-layer-on-Si-wafer.pdf
끂3433 512.93 KB -
2018-03-26 Technology-ellipsometry-with-the-example-graphene.pdf
끂3200 1.81 MB -
2018-03-26 Principles-of-Imaging-Ellipsometry.pdf
끂3492 481.2 KB -
2018-03-26 Microstructured-lipid-bilayers.pdf
끂3106 753.45 KB -
2018-03-26 Micropatterned-Polymer-Films.pdf
끂1454 792.06 KB -
2018-03-26 Microcontact-Printed-Monolayers-inspected-with-Imaging-Ellipsometry-and-Scanning-Probe-Microscopy.pdf
끂1442 439.33 KB -
2018-03-26 Mapping-of-a-thick-transparent-layer.pdf
끂1461 459.68 KB -
2018-03-26 Local-Influence-on-Optical-Properties-and-Thickness-of-ITO-Films-by-Means-of-Plasma-Flow.pdf
끂1409 263.56 KB -
2018-03-26 Laser-Diodes.pdf
끂1490 471.61 KB -
2018-03-26 Kinetic-Binding-Studies-using-OptiSlides.pdf
끂1446 1 MB
-
2018-03-26 Thickness-measurement-of-SiO2-layer-on-Si-wafer.pdf
끂3433 512.93 KB -
2018-03-26 Technology-ellipsometry-with-the-example-graphene.pdf
끂3200 1.81 MB -
2018-03-26 Principles-of-Imaging-Ellipsometry.pdf
끂3492 481.2 KB -
2018-03-26 Microstructured-lipid-bilayers.pdf
끂3106 753.45 KB
- 2018-04-02
- 2018-04-02
欧库睿因科学仪器（上海）有限公司
关于欧库睿因
联系地址：
上海市徐汇区裕德路168号徐汇商务大厦502 (200030)
联系电话：
021-50179099; 021-54590200
咨询邮箱：
Info@accurion.com.cn
Copyright 2011 ACCURION All Rights Reserved. 欧库睿因科学仪器（上海）有限公司 版权所有
沪ICP备17000656号-1 / 京公网安备11010802009035号
